Lightweight Defect Localization for Java
by Valentin Dallmeier, Christian Lindig, Andreas Zeller

Andrew P. Black (Ed.), Proceedings of 19th European Conference on Object-Oriented Programming, ECOOP 2005, Pages 528-550, Lecture Notes in Computer Science, Number 3586, Springer, July 2005.

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Abstract

A common method to localize defects is to compare the coverage of passing and failing program runs: A method executed only in failing runs, for instance, is likely to point to the defect. Some failures, though, come to be only through a specific sequence of method calls, such as multiple deallocation of the same resource. Such sequences can be collected from arbitrary Java programs at low cost; comparing object-specific sequences predicts defects better than simply comparing coverage. In a controlled experiment, our technique pinpointed the defective class in 39\% of all test runs.

BibTeX Entry

@inproceedings{dallmeier-ecoop-2005,
    title = "Lightweight Defect Localization for Java",
    author = "Valentin Dallmeier and Christian Lindig and Andreas Zeller",
    year = "2005",
    month = jul,
    booktitle = "Proceedings of 19th European Conference on Object-Oriented Programming, ECOOP 2005",
    editors = "Andrew P. Black",
    location = "Glasgow, UK",
    number = "3586",
    pages = "528--550",
    publisher = "Springer",
    series = "Lecture Notes in Computer Science",
}

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