Lightweight Defect Localization for Java
by
Valentin Dallmeier, Christian Lindig, Andreas Zeller
Andrew P. Black (Ed.), Proceedings of 19th European Conference on Object-Oriented Programming, ECOOP 2005, Pages 528-550, Lecture Notes in Computer Science, Number 3586, Springer, July 2005.
Abstract
A common method to localize defects is to compare the coverage of passing and failing program runs: A method executed only in failing runs, for instance, is likely to point to the defect. Some failures, though, come to be only through a specific sequence of method calls, such as multiple deallocation of the same resource. Such sequences can be collected from arbitrary Java programs at low cost; comparing object-specific sequences predicts defects better than simply comparing coverage. In a controlled experiment, our technique pinpointed the defective class in 39\% of all test runs.
BibTeX Entry
@inproceedings{dallmeier-ecoop-2005,
title = "Lightweight Defect Localization for Java",
author = "Valentin Dallmeier and Christian Lindig and Andreas Zeller",
year = "2005",
month = jul,
booktitle = "Proceedings of 19th European Conference on Object-Oriented Programming, ECOOP 2005",
editors = "Andrew P. Black",
location = "Glasgow, UK",
number = "3586",
pages = "528--550",
publisher = "Springer",
series = "Lecture Notes in Computer Science",
}