Model Mining
Lightweight Defect Localization for Java

Valentin Dallmeier, Christian Lindig, Andreas Zeller: Lightweight Defect Localization for Java. Proceedings of 19th European Conference on Object-Oriented Programming, ECOOP 2005, Andrew P. Black (Ed.), pages 528--550, Lecture Notes in Computer Science 3586, Springer, Glasgow, UK, July 2005.[PDF]

A common method to localize defects is to compare the coverage of p assing and failing program runs: A method executed only in failing runs, for ins tance, is likely to point to the defect. Some failures, though, come to be only through a specific sequence of method calls, such as multiple deallocation of th e same resource. Such sequences can be collected from arbitrary Java programs at low cost; comparing object-specific sequences predicts defects better than simp ly comparing coverage. In a controlled experiment, our technique pinpointed the defective class in 39% of all test runs.

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